Formation of Transparent and Ohmic Nanostructure Thin Films of Fluorine-Doped Indium Oxide Prepared by Spray

S. M. Rozati
Department of Physics, University of Guilan, Iran

Z. Bargbidi
Department of Physics, University of Guilan, Iran

Ladda ner artikelhttp://dx.doi.org/10.3384/ecp110572795

Ingår i: World Renewable Energy Congress - Sweden; 8-13 May; 2011; Linköping; Sweden

Linköping Electronic Conference Proceedings 57:14, s. 2795-2799

Visa mer +

Publicerad: 2011-11-03

ISBN: 978-91-7393-070-3

ISSN: 1650-3686 (tryckt), 1650-3740 (online)


In this research; indium oxide nanostructure undoped and doped with F were prepared on glass substrates using spray pyrolysis technique. Various parameters such as dopant concentration; deposition temperatures; amount of indium oxide powder were discussed. Structural properties of these films were investigated by XRD & SEM. Electrical and optical properties have been studied by Hall Effect and UV-Visible spectrophotometer respectively. The thickness of the films is determined by PUMA software. The variation in refractive index; extension coefficient and band gap of these films also were investigated.


Indium oxide;Indium doped oxide;Spray pyrolysis


[1] K.I. Chopra; S. Major; D.K. Pandya; Thin Solid Films; 102; (1983); 1. doi: 10.1016/0040-6090(83)90256-0.

[2] C.V.R. Vasant Kumar; A.A. Mansingh; J. Appl. Phys.; 65; (1989); 1270. doi: 10.1063/1.343022.

[3] J.A. Anna Selvan; A.E. Delahoy; S. Guo; Y. Li; A new light trapping TCO for nc-Si:H solar cells; Solar Energy Mater. Solar Cells; 90; (2006); 3371–3376. doi: 10.1016/j.solmat.2005.09.018.

[4] G. Korotcenkov; V. Brinzari; A. Cerneavschi; Sensors and Actuators B; 98; (2004); 122–129. doi: 10.1016/j.snb.2003.09.009.

[5] S.M. Rozati; S. Mirzapour; M.G. Takwale;B.R. Marathe; V.G. Bhide; Materials Chemistry and Physics; 34; (1993); 119. doi: 10.1016/0254-0584(93)90201-V.

[6] S. Boycheva; A.K. Sytchkova; M.L. Grilli; A. Piegari; Thin Solid Films; 515; (2007); 8469. doi: 10.1016/j.tsf.2007.03.165.

[7] S. Golshahi; S.M. Rozati; R. Martins; E. Fortunato; Thin Solid Films; 518; (2009); 1149-1152. doi: 10.1016/j.tsf.2009.04.074.

[8] R.B.H. Tahar; T. Ban; Y. Ohya; Y. Takahashi; J. Appl. Phys.; 82; (1997); 865. doi: 10.1063/1.365786.

[9] G. Haacke; J. Appl. Phys.; 47 (1976) 4086. doi: 10.1063/1.323240.

[10] E.J. Biring; I. Chambouleyron; J.M. Martinez; Estimation of the optical constants and the thickness of thin films using unconstrained optimization; Journal of Computational Physics; 155 (1999) 862-880.

Citeringar i Crossref